Development and Characterization of a Flat-Panel Detector-Based Microtomography System

Sang Chul Lee; Hok Yung Kim; In Kon Chun; Myung Hye Cho; Min Hyoung Cho; Soo Yeol Lee

doi:10.4028/www.scientific.net/KEM.270-273.245

Paper Titles

A Systolic Multi-Layer and Multi-Line Stereo Vision System for 3D Visual Inspection
p.221

Transform Coding of Arbitrarily Shaped Regions in Ultrasonic Data
p.227

Line Defect Detection in TFT-LCD Using Directional Filter Bank and Adaptive Multilevel Thresholding
p.233

Time-Domain Noise Analysis of CMOS Readout Ic for CZT X-Ray Detectors
p.239

Development and Characterization of a Flat-Panel Detector-Based Microtomography System
p.245

Detection of Operational Abnormality of Ball Bearing with Ultrasonic Technique
p.252

Non-Destructive Evaluation Using Laser-Generated Ultrasonic Waves
p.258

A Study on the Characteristics of Surface Wave Induced by Phased Array Ut
p.264

Implementation of Ultrasonic Immersion Technique for Babbitt Metal Debonding in Turbine Bearing
p.271

HomeKey Engineering MaterialsKey Engineering Materials Vols. 270-273Development and Characterization of a Flat-Panel...

Development and Characterization of a Flat-Panel Detector-Based Microtomography System

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Key Engineering Materials (Volumes 270-273)

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245-251

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https://doi.org/10.4028/www.scientific.net/KEM.270-273.245

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Online since:

August 2004

Authors:

Sang Chul Lee, Hok Yung Kim, In Kon Chun, Myung Hye Cho, Min Hyoung Cho, Soo Yeol Lee

Keywords:

3-D Imaging, CMOS, Flat-Panel Detector, Microtomography

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