Time-Domain Noise Analysis of CMOS Readout Ic for CZT X-Ray Detectors

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Periodical:

Key Engineering Materials (Volumes 270-273)

Edited by:

Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee

Pages:

239-244

Citation:

T. H. Lee et al., "Time-Domain Noise Analysis of CMOS Readout Ic for CZT X-Ray Detectors", Key Engineering Materials, Vols. 270-273, pp. 239-244, 2004

Online since:

August 2004

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[7] B. Pellegrini, R. Saletti, B. Neri, and P. Terreni: Noise in Physical Systems and 1/f Noise, Amsterdam, Netherlands, Elsevier, (1985).

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