Time-Domain Noise Analysis of CMOS Readout Ic for CZT X-Ray Detectors

Tae Hoon Lee; Jang Ho Ha; Sang Yoon Lee; Won Il Ko; Dae Yong Song; Ho Dong Kim

doi:10.4028/www.scientific.net/KEM.270-273.239

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Multiplierless Sigma-Delta Modulation Beam Forming for Ultrasound Nondestructive Testing
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A Systolic Multi-Layer and Multi-Line Stereo Vision System for 3D Visual Inspection
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Transform Coding of Arbitrarily Shaped Regions in Ultrasonic Data
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Line Defect Detection in TFT-LCD Using Directional Filter Bank and Adaptive Multilevel Thresholding
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Time-Domain Noise Analysis of CMOS Readout Ic for CZT X-Ray Detectors
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Development and Characterization of a Flat-Panel Detector-Based Microtomography System
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Detection of Operational Abnormality of Ball Bearing with Ultrasonic Technique
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Non-Destructive Evaluation Using Laser-Generated Ultrasonic Waves
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A Study on the Characteristics of Surface Wave Induced by Phased Array Ut
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Time-Domain Noise Analysis of CMOS Readout Ic for CZT X-Ray Detectors

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Key Engineering Materials (Volumes 270-273)

Pages:

239-244

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.270-273.239

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Online since:

August 2004

Authors:

Tae Hoon Lee, Jang Ho Ha, Sang Yoon Lee, Won Il Ko, Dae Yong Song, Ho Dong Kim

Keywords:

Low-Noise Analog Readout, Time-Domain Noise Simulation

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