Development of a Large Range Nanometer Level Profilometer with Controlled Contact Force

Article Preview

Abstract:

A nanometer profilometer in which the measuring force can be controlled is proposed. The key part is the nanometer profiling core, which consists of a voice coil motor with a short and movable voice coil and an inductive transducer. According to the A/D value of the transducer signal, the measuring force can be adjusted to approximately µN level by use of a PID control algorithm. The advantages of contact type and non-contact type profilometer are possessed by the proposed instrument.

You might also be interested in these eBooks

Info:

Periodical:

Key Engineering Materials (Volumes 295-296)

Pages:

489-494

Citation:

Online since:

October 2005

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2005 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] M. Chuard, J. Mignot, P. Nardin and D. Rondot: J Manufacturing Systems, Vol. 6 (1986), p.223.

Google Scholar

[2] L.P. Howard and S.T. Smith: Review of Science Instrument, Vol. 63 (1992), p.4289.

Google Scholar

[3] D.G. Chetwynd, X. Liu and S.T. Smith: Precision Engineering, Vol. 19 (1995), p.105.

Google Scholar

[4] L.P. Howard and S.T. Smith: Review of Science Instrument, Vol. 65 (1994), p.892.

Google Scholar