Domain Switching and Crack Tip Opening Stress Variation in Ferroelectric Ceramics

Abstract:

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Evolution of switching zone near a crack tip in ferroelectric ceramics is calculated using the constitutive equations proposed in [1], with an assumption that switching-induced internal fields are minimized by fine domain microstructures and moving charges. A two-dimensional ferroelectric ceramic specimen that has an edge crack and that is poled perpendicular to the crack plane are subjected to external stress and electric fields. Diverse crack tip microstructures are obtained depending on both the history and the ratio of electric and stress loads. It is shown that opposite crack tip opening stresses under the same electric fields are due to opposite distributions of piezoelectric coefficients in the specimens with different crack tip microstructures.

Info:

Periodical:

Key Engineering Materials (Volumes 297-300)

Edited by:

Young-Jin Kim, Dong-Ho Bae and Yun-Jae Kim

Pages:

2557-2566

DOI:

10.4028/www.scientific.net/KEM.297-300.2557

Citation:

S. J. Kim and Y. J. Kim, "Domain Switching and Crack Tip Opening Stress Variation in Ferroelectric Ceramics ", Key Engineering Materials, Vols. 297-300, pp. 2557-2566, 2005

Online since:

November 2005

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Price:

$35.00

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