Evaluation of Creep-Fatigue Life Using Backscattering of Rayleigh Surface Wave

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The application of nondestructive evaluation to creep-fatigue damage was examined in this paper. Generally, as the hold time of static load increases, the degradation of material becomes more rapid and the creep-fatigue life decreases. Therefore, in the evaluation of creep-fatigue strength and life of high-pressure vessel such as main steam pipe at high temperature is very important in power plants. In this study, the creep-fatigue behavior of P92 steel was evaluated nondestructively by the backscattered ultrasound using the creep-fatigue specimens. The results obtained by Rayleigh surface wave of backscattered ultrasound were compared and analyzed with the experimental parameters. Also, the relation between the SDA (slope of degraded area) and creep-fatigue life was examined. From the result of nondestructive test, we suggest that SDA would be used as the new parameter for the evaluation of creep-fatigue damage. As the degradation increased, the SDA decreased and also the creep-fatigue life decreased.

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Key Engineering Materials (Volumes 297-300)

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415-420

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November 2005

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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[1] M.E. Kassener and T.A. Hayes: Int. Plasticity Vol. 19 (2003), p.34.

Google Scholar

[2] U.B. Baek, C.M. Suh and K.B. Yoon: J. KWS. Vol. 18 (2000), p.89.

Google Scholar

[3] B.S. Lim, C.S. Jeong and Y.T. Keum: Met. Mater. - Int. Vol. 9 (2003), p.543.

Google Scholar

[4] J.H. Kim, Y.J. Oh, I.S. Hwang, D.J. Kim and J.T. Kim: J. Nuclear Mater. 299 (2001), p.132.

Google Scholar

[5] K.B. Yoon, K.W. Kim and U.B. Baek: J. KSME A. Vol. 22 (1998), p.2153.

Google Scholar

[6] B.J. Kim, S.H. Ryu and B.S. Lim: Met. Mater. - Int. Vol. 9 (2004), p.19.

Google Scholar

[7] S. Sasaki: Jpn J. Appl. Phys. Vol. 2 (1963), p.198.

Google Scholar

[8] H.C. Kim, J.K. Lee, S.Y. Kim and S.D. Kwon: Jpn. J. Appl. Phys. Vol. 38 Part 1 (2001), p.260.

Google Scholar

[9] S.D. Kwon, M.S. Choi and S.H. Lee: NDT & E International Vol. 33 (2000), p.275.

Google Scholar

[10] Y.H. Kim, S.J. Song, D.H. Bae and S.D. Kwon: Ultrasonics Vol. 42 (2000), p.545.

Google Scholar