Warpage Analysis of FBGA (Fine Ball Grid Array) Package by the Altered EMC (Epoxy Molding Compound) Filler Contents

Abstract:

Article Preview

In a semiconductor packaging process, the warpage greatly has influenced the reliability of the package as well as the workability. The strip warpage in FBGA package result from the structure of constitutes and the thermal mismatch by the mechanical or thermal properties such as CTE (Coefficient of Thermal Expansion) and Modulus of EMC, substrate, chip and adhesive materials. Therefore, the optimization of material properties and the package structure design has been needed by the numerical analysis. EMC used as one of the package constituents has a decisive effect on the trend of warpage, and the filler content is dominant in the EMC property. In this research, firstly the effect of the filler contents is evaluated in the warpage of FBGA package and the numerical analysis is performed with the high temperature – material properties to deal with the warpage under the actual measurement value.

Info:

Periodical:

Key Engineering Materials (Volumes 306-308)

Edited by:

Ichsan Setya Putra and Djoko Suharto

Pages:

625-630

DOI:

10.4028/www.scientific.net/KEM.306-308.625

Citation:

Y. T. Park et al., "Warpage Analysis of FBGA (Fine Ball Grid Array) Package by the Altered EMC (Epoxy Molding Compound) Filler Contents", Key Engineering Materials, Vols. 306-308, pp. 625-630, 2006

Online since:

March 2006

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.