Three-Dimensional Micromachining Based on AFM

Article Preview

Abstract:

With the development of science and technology, Atomic Force Microscope is widely applied to the field of machining process in nanometer scale. Due to the limitation of the inventive purpose of AFM, only height mode and deflection mode can be applied in AFM-tip micromachining. It can’t control the machining depth during the micromachining process at present. In this paper, a new micromachining system is set up, which composed of a high precision three-dimensional stage, an AFM, a diamond probe and a special control device. By utilizing variation parameters PID algorithm and controlling the machining depth directly, the micromachining system can resolve the problem mentioned above.

You might also be interested in these eBooks

Info:

Periodical:

Key Engineering Materials (Volumes 315-316)

Pages:

800-804

Citation:

Online since:

July 2006

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2006 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] G. Binning and H. Roher: Phys. Acta., Vol. 55 (1982), p.726.

Google Scholar

[2] G. Binning and C.F. Quate: Phys. Reve. Lett., Vol. 56 (1986), p.930.

Google Scholar

[3] P. Hobbs and et al: Appl. Phys. Lett., Vol. 55 (1989) No. 22, pp.2357-2359.

Google Scholar

[4] W.J. Laiser and L.D. Bell: Phys. Rev. Lett., Vol. 60 (1988), p.1406.

Google Scholar

[5] M. Nonne: Appl. Phys. Lett., Vol. 58 (1991) No. 25, p.2921.

Google Scholar

[6] C. Barrett and C.F. Quate: J. Vac. Sci. Technology, Vol. A8 (1990), p.400.

Google Scholar

[7] H. Heinzel and D.W. Pohl: Applied Physics A-Solid and Surface, Vol. 59 (1994), pp.89-101.

Google Scholar

[8] R.S. Becker and J.A. Golorchenko and et al: Nature, Vol. 325 (1987) 29, pp.419-421.

Google Scholar

[9] H.D. Day and D.R. Allee: Appl. Phys. Lett., Vol. 62 (1993) No. 26, pp.2691-2693.

Google Scholar

[10] Q.L. Zhao, S. Dong and X.L. Zhang: Jixie Gongcheng Xuebao, Vol. 36 (2000) No. 11, pp.64-69.

Google Scholar

[11] J.F. Xia, T. Sun, Y.D. Yan, Y.C. Liang, K. Cheng and S. Dong: Optics and Precision Engineering, Vol. 11 (2003) No. 2, pp.125-129.

Google Scholar

[12] T.H. Zhang: Micro/nano. Mach. Testing Tech. and App. ( China Machine Press, China 2005).

Google Scholar