A New Algorithm with Distance Constraint for Large-Scale Profile Measurement

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Periodical:

Key Engineering Materials (Volumes 326-328)

Edited by:

Soon-Bok Lee and Yun-Jae Kim

Pages:

159-162

DOI:

10.4028/www.scientific.net/KEM.326-328.159

Citation:

Y. Q. Wang et al., "A New Algorithm with Distance Constraint for Large-Scale Profile Measurement", Key Engineering Materials, Vols. 326-328, pp. 159-162, 2006

Online since:

December 2006

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$35.00

[1] Frank Chen, Gordon M. Brown and Mumin Song: Overview of three-dimensional shape measurement using optical methods, Optical Engineering, 2000, Vol. 39(1), P. 10-21.

DOI: 10.1117/1.602438

[2] Feng wenhao: Close-range photogrammetry (The publishing company of Wuhan university, Wuhan 2002).

[3] Lu naiguang, Deng wenyi, and Wang yongqiang: profile measurement of microwave antenna using close range photogrammetry. Proc. SPIE, 2004, 5852, P. 508-514.

[4] Tsai R: A Versatile camera Calibration Technique for High-Accuracy 3D Machine Vision Metrology Using Off-the-Shelf TV Cameras and Lenses. IEEE Trans Robotics and Automation. Vol. RA-3 (1987), P. 323-344.

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