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HomeKey Engineering MaterialsKey Engineering Materials Vols. 326-328A New Algorithm with Distance Constraint for...

A New Algorithm with Distance Constraint for Large-Scale Profile Measurement

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Experimental Mechanics in Nano and Biotechnology

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Periodical:

Key Engineering Materials (Volumes 326-328)

Pages:

159-162

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.326-328.159

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Online since:

December 2006

Authors:

Yong Qiang Wang, Nai Guang Lu, Wen Yi Deng, Ming Li Dong

Keywords:

Bundle Adjustment, Profile Measurement, Videogrammetry

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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[1] Frank Chen, Gordon M. Brown and Mumin Song: Overview of three-dimensional shape measurement using optical methods, Optical Engineering, 2000, Vol. 39(1), P.10-21

DOI: 10.1117/1.602438

[2] Feng wenhao: Close-range photogrammetry (The publishing company of Wuhan university, Wuhan 2002).

[3] Lu naiguang, Deng wenyi, and Wang yongqiang: profile measurement of microwave antenna using close range photogrammetry. Proc. SPIE, 2004, 5852, P.508-514

[4] Tsai R: A Versatile camera Calibration Technique for High-Accuracy 3D Machine Vision Metrology Using Off-the-Shelf TV Cameras and Lenses. IEEE Trans Robotics and Automation. Vol. RA-3 (1987), P.323-344

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