Propagation and Deflection of Electric-Field-Induced Microcracks in 0.69Pb(Mg1/3Nb2/3)O3-0.31PbTiO3 Ferroelectric Single Crystals
Propagation and deflection of microcracks driven by electric loading in <001>-oriented 0.69Pb(Mg1/3Nb2/3)O3-0.31PbTiO3 ferroelectric single crystals were investigated using an in-situ transmission electron microcopy (TEM) technique. The static observation of the domain pattern revealed the coexistence of sub-micrometer and nano-meter domains. Electric field induced deviation from the main microcrack path and subsequent propagation along the direction almost perpendicular to the electric field were observed directly. A qualitative analyses is given based on the maximum energy release rate criterion.
Wei Pan and Jianghong Gong
Y. Zhang and Z. Xu, "Propagation and Deflection of Electric-Field-Induced Microcracks in 0.69Pb(Mg1/3Nb2/3)O3-0.31PbTiO3 Ferroelectric Single Crystals", Key Engineering Materials, Vols. 336-338, pp. 363-366, 2007