Propagation and Deflection of Electric-Field-Induced Microcracks in 0.69Pb(Mg1/3Nb2/3)O3-0.31PbTiO3 Ferroelectric Single Crystals

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Propagation and deflection of microcracks driven by electric loading in <001>-oriented 0.69Pb(Mg1/3Nb2/3)O3-0.31PbTiO3 ferroelectric single crystals were investigated using an in-situ transmission electron microcopy (TEM) technique. The static observation of the domain pattern revealed the coexistence of sub-micrometer and nano-meter domains. Electric field induced deviation from the main microcrack path and subsequent propagation along the direction almost perpendicular to the electric field were observed directly. A qualitative analyses is given based on the maximum energy release rate criterion.

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Periodical:

Key Engineering Materials (Volumes 336-338)

Edited by:

Wei Pan and Jianghong Gong

Pages:

363-366

DOI:

10.4028/www.scientific.net/KEM.336-338.363

Citation:

Y. Zhang and Z. Xu, "Propagation and Deflection of Electric-Field-Induced Microcracks in 0.69Pb(Mg1/3Nb2/3)O3-0.31PbTiO3 Ferroelectric Single Crystals", Key Engineering Materials, Vols. 336-338, pp. 363-366, 2007

Online since:

April 2007

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$35.00

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