Propagation and Deflection of Electric-Field-Induced Microcracks in 0.69Pb(Mg_1/3Nb_2/3)O₃-0.31PbTiO₃ Ferroelectric Single Crystals

Abstract:

Propagation and deflection of microcracks driven by electric loading in <001>-oriented 0.69Pb(Mg1/3Nb2/3)O3-0.31PbTiO3 ferroelectric single crystals were investigated using an in-situ transmission electron microcopy (TEM) technique. The static observation of the domain pattern revealed the coexistence of sub-micrometer and nano-meter domains. Electric field induced deviation from the main microcrack path and subsequent propagation along the direction almost perpendicular to the electric field were observed directly. A qualitative analyses is given based on the maximum energy release rate criterion.

• Periodical: Key Engineering Materials (Volumes 336-338)
• Pages: 363-366
• DOI: https://doi.org/10.4028/www.scientific.net/KEM.336-338.363
• Online since: April 2007
• Authors: Yong Zhang, Z. Xu
• Keywords: Ferroelectric, In Situ TEM, Microcrack

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