A Simple and Direct Method for Local Temperature Measurement and its Applications to Materials Evaluations

Abstract:

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General thermometers pose difficulty in measuring the actual surface temperature of a micro-area, especially in electronic devices. In the present study, an approach to direct measurement of surface temperature is described, which utilizes the potential of melting point of different chemical reagents. The present technique exhibits a temperature resolution of about 5○C and the measurable maximum temperature of about 200○C. A short comment on the application of the technique to determine the actual surface temperature of small areas in some engineering applications is also stated.

Info:

Periodical:

Key Engineering Materials (Volumes 345-346)

Edited by:

S.W. Nam, Y.W. Chang, S.B. Lee and N.J. Kim

Pages:

1279-1282

DOI:

10.4028/www.scientific.net/KEM.345-346.1279

Citation:

T. Hasegawa et al., "A Simple and Direct Method for Local Temperature Measurement and its Applications to Materials Evaluations ", Key Engineering Materials, Vols. 345-346, pp. 1279-1282, 2007

Online since:

August 2007

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Price:

$35.00

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