Determining the Thickness and Refractive Index of a Birefringence by Using an Improved Accurate Measurement System

Abstract:

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This paper presents a high-precision, non-destructive measurement system for determining the thickness and refractive indices of birefringent optical wave plates. Significantly, the proposed method enables the two refractive indices of the optical sample to be measured simultaneously. The performance of the proposed system is verified using a commercial quartz optical wave plate with known refractive indices of 1.5518 e n = and 1.5427 o n = , respectively, and a thickness of 452.1428 μm. The experimentally determined values of the refractive indices are found to be 1.55190 e n = and 1.54281 o n = , respectively, while the thickness is found to be 452.189 μm, corresponding to an experimental error of approximately 0.046 μm. The measurement resolution of the proposed system exceeds that of the interferometer hardware itself and provides a simple yet highly accurate means of measuring the principal optical parameters of birefringent glass wave plates.

Info:

Periodical:

Key Engineering Materials (Volumes 364-366)

Edited by:

Guo Fan JIN, Wing Bun LEE, Chi Fai CHEUNG and Suet TO

Pages:

510-515

DOI:

10.4028/www.scientific.net/KEM.364-366.510

Citation:

Y. L. Yeh et al., "Determining the Thickness and Refractive Index of a Birefringence by Using an Improved Accurate Measurement System", Key Engineering Materials, Vols. 364-366, pp. 510-515, 2008

Online since:

December 2007

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Price:

$35.00

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