A Study on Surface Material Measures for Areal Surface Texture Measuring Instruments: Measuring Conditions for the Areal Profiling

Kentaro Nemoto; Kazuhisa Yanagi; Masato Aketagawa; D. Kanda; I. Yoshida; M. Uchidate

doi:10.4028/www.scientific.net/KEM.381-382.241

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 381-382A Study on Surface Material Measures for Areal...

A Study on Surface Material Measures for Areal Surface Texture Measuring Instruments: Measuring Conditions for the Areal Profiling

Abstract:

This paper describes the software gauge data for surface texture standard using the non-causal 2D auto-regressive model (A-R model). This model can provide with 3D irregular surface topography and intentional geometrical characteristics from specified surface texture parameters. The measurement area consists of a periodical combination of the generated sampling area data. The surface roughness parameters introduced from the gauge data on a defined evaluation area can be insensitive to size and location of the evaluation area size. Adequate measuring conditions to utilize the surface material measures were investigated and then the evaluation area and sampling distance for areal profiling by a stylus instrument were clarified.

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Periodical:

Key Engineering Materials (Volumes 381-382)

Pages:

241-244

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.381-382.241

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Online since:

June 2008

Authors:

Kentaro Nemoto, Kazuhisa Yanagi, Masato Aketagawa, D. Kanda, I. Yoshida, M. Uchidate

Keywords:

Areal Surface Texture, Calibration, Material Measure, Software Gauge, Surface Metrology

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References

[1] ISO 5436-1: 2000, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Measurement standards - Part 1: Material measures (JIS B 0659-1: 2002).

DOI: 10.3403/02337030

Google Scholar

[2] ISO 4288: 1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Rules and procedure for the assessment of surface texture (JIS B 0633: 2001).

DOI: 10.3403/02337030

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[3] M. Uchidate, T. Shimizu, A. Iwabuchi and K. Yanagi, Wear, 257, (2004), 1288-1295.

DOI: 10.1016/j.wear.2004.05.019

Google Scholar

[4] K. Nemoto, M. Aketagawa, M. Uchidate, K. Yanagi, H. Maruyama, D. Kanda and I. Yoshida, Program and Abstracts Second International Symposium on Standard Materials And Metrology for Nanotechnology, (2006), P2-2.

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