Freeform Surface Measurement from a Single Encoded Image Captured by a Camera with Varying Parameters

Abstract:

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In this paper, we present a method of measuring a freeform surface profile from a single image taken by a vision system consisting of a digital camera and a pattern projector. The measurement can be implemented without calibrating the camera’s parameters, provided that the intrinsic and extrinsic parameters of the projector are known. The method enables the camera to have much more adaptability for measuring a stationary or moving object with complex shape of surface.

Info:

Periodical:

Key Engineering Materials (Volumes 381-382)

Edited by:

Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek

Pages:

379-382

DOI:

10.4028/www.scientific.net/KEM.381-382.379

Citation:

R. S. Lu et al., "Freeform Surface Measurement from a Single Encoded Image Captured by a Camera with Varying Parameters", Key Engineering Materials, Vols. 381-382, pp. 379-382, 2008

Online since:

June 2008

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Price:

$35.00

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