Freeform Surface Measurement from a Single Encoded Image Captured by a Camera with Varying Parameters

Rong Sheng Lu; Z.J. Liu; X.M. Dang; P.H. Hu

doi:10.4028/www.scientific.net/KEM.381-382.379

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 381-382Freeform Surface Measurement from a Single Encoded...

Freeform Surface Measurement from a Single Encoded Image Captured by a Camera with Varying Parameters

Abstract:

In this paper, we present a method of measuring a freeform surface profile from a single image taken by a vision system consisting of a digital camera and a pattern projector. The measurement can be implemented without calibrating the camera’s parameters, provided that the intrinsic and extrinsic parameters of the projector are known. The method enables the camera to have much more adaptability for measuring a stationary or moving object with complex shape of surface.

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Key Engineering Materials (Volumes 381-382)

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379-382

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.381-382.379

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Online since:

June 2008

Authors:

Rong Sheng Lu, Z.J. Liu, X.M. Dang, P.H. Hu

Keywords:

Camera, Freeform Surfaces, Machine Vision, Projector

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