Freeform Surface Measurement from a Single Encoded Image Captured by a Camera with Varying Parameters
In this paper, we present a method of measuring a freeform surface profile from a single image taken by a vision system consisting of a digital camera and a pattern projector. The measurement can be implemented without calibrating the camera’s parameters, provided that the intrinsic and extrinsic parameters of the projector are known. The method enables the camera to have much more adaptability for measuring a stationary or moving object with complex shape of surface.
Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek
R. S. Lu et al., "Freeform Surface Measurement from a Single Encoded Image Captured by a Camera with Varying Parameters", Key Engineering Materials, Vols. 381-382, pp. 379-382, 2008