Achieving Nanorad Level Stability of Beam Deflection with Scanning Pentaprisms

Article Preview

Abstract:

A movable pentaprism is a key element in deflectometric profilers, where it directs the beam of an angle measuring device towards the surface under test and enables at the same time the flexible lateral displacement of the beam footprint on the surface. The beam deflection angle of the pentaprism is robust with regard to changes in its angular orientation. Optimal stability is achieved, however, only when the angle measuring device, the pentaprism, and the surface have initially been properly aligned. A newly developed procedure enables the rapid and accurate in-situ adjustment of all angles of the optical components in deflectometric set-ups with an uncertainty of several microrad. In combination with precision mechanical stages, variations in the prism’s deflection angle (caused by changes in its angular orientation) can then be limited to the nanorad level.

You might also be interested in these eBooks

Info:

Periodical:

Key Engineering Materials (Volumes 381-382)

Pages:

547-548

Citation:

Online since:

June 2008

Authors:

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2008 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] I. Weingärtner, M. Schulz and C. Elster: Proc. SPIE, 3782 (1999), pp.306-317.

Google Scholar

[2] C. Elster and I. Weingärtner: Appl. Optics, 38(23) (1999), pp.5024-5031.

Google Scholar

[3] R.D. Geckeler and I. Weingärtner: Proc. SPIE, 4779 (2002), pp.1-12.

Google Scholar

[4] R.D. Geckeler: Proc. SPIE, 6293 (2006), 62930O.

Google Scholar

[5] R.D. Geckeler: Meas. Sci. Technol., 18(1) (2007), pp.115-125.

Google Scholar

[6] Guide to the Expression of Uncertainty in Measurement (ISO, Geneva 1993).

Google Scholar