On the Measurement of Dielectric Constant of Coatings with Capacitance Sensors
In this work we show that in many practical situations it is possible to obtain the dielectric constant of coatings on plane conductive substrates by means of capacitance measurements with a single electrode without precise knowledge of the thickness.
Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek
A. Guadarrama-Santana and A. García-Valenzuela, "On the Measurement of Dielectric Constant of Coatings with Capacitance Sensors", Key Engineering Materials, Vols. 381-382, pp. 533-536, 2008