On the Measurement of Dielectric Constant of Coatings with Capacitance Sensors

Abstract:

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In this work we show that in many practical situations it is possible to obtain the dielectric constant of coatings on plane conductive substrates by means of capacitance measurements with a single electrode without precise knowledge of the thickness.

Info:

Periodical:

Key Engineering Materials (Volumes 381-382)

Edited by:

Wei Gao, Yasuhiro Takaya, Yongsheng Gao and Michael Krystek

Pages:

533-536

DOI:

10.4028/www.scientific.net/KEM.381-382.533

Citation:

A. Guadarrama-Santana and A. García-Valenzuela, "On the Measurement of Dielectric Constant of Coatings with Capacitance Sensors", Key Engineering Materials, Vols. 381-382, pp. 533-536, 2008

Online since:

June 2008

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Price:

$35.00

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