Dielectric Properties of SiAlON Ceramics

Abstract:

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The dielectric properties of -SiAlON and various cations doped -SiAlON bulk ceramics prepared by a hot-press method were investigated. The dielectric properties (dielectric constant and tangent loss) were characterized by a post-resonator method (Hakki-Coleman method) at room temperature in the microwave frequency range. The effect of z-values about -SiAlON was examined, and also the effects of various interstitial cations on dielectric properties of -SiAlON were studied. Dielectric properties of -SiAlON were compared with those of Si3N4 and -SiAlON and their relationship between the dielectric properties and the cationic species of SiAlON were discussed.

Info:

Periodical:

Edited by:

Katsutoshi Komeya, Yi-Bing Cheng, Junichi Tatami and Mamoru Mitomo

Pages:

125-128

DOI:

10.4028/www.scientific.net/KEM.403.125

Citation:

D. K. Kim et al., "Dielectric Properties of SiAlON Ceramics", Key Engineering Materials, Vol. 403, pp. 125-128, 2009

Online since:

December 2008

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$35.00

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