Dielectric Properties of SiAlON Ceramics

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Abstract:

The dielectric properties of -SiAlON and various cations doped -SiAlON bulk ceramics prepared by a hot-press method were investigated. The dielectric properties (dielectric constant and tangent loss) were characterized by a post-resonator method (Hakki-Coleman method) at room temperature in the microwave frequency range. The effect of z-values about -SiAlON was examined, and also the effects of various interstitial cations on dielectric properties of -SiAlON were studied. Dielectric properties of -SiAlON were compared with those of Si3N4 and -SiAlON and their relationship between the dielectric properties and the cationic species of SiAlON were discussed.

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125-128

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December 2008

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© 2009 Trans Tech Publications Ltd. All Rights Reserved

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