Material Removal Model of Sapphire Substrate in Double-Side Lapping Process

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Abstract:

The material removal mechanisms of sapphire substrate in double-side lapping process were studied. The concepts of brittle vs. ductile machining and two-body vs. three-body abrasion were used to classify the processing mechanisms. The material removal models of double-side lapping process in different mechanisms were analyzed and researched. The experiment showed that the material removal model can describe double-side lapping process of sapphire qualitatively.

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Periodical:

Key Engineering Materials (Volumes 407-408)

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460-464

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Online since:

February 2009

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© 2009 Trans Tech Publications Ltd. All Rights Reserved

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[1] C.D. Lu: Study on Free Damage Mechanism of Precision Lapping Sapphire Wafer for High Lighting Light Emitting Diode (Zhejiang University of Technology, Hangzhou, 2007).

Google Scholar

[2] J. A. Williams, A. M. Hyncica: Wear, Vol. 152 (1992), p.57-74.

Google Scholar

[3] T. Moriwaki, E. Shamoto, K. Inoue: ClRP Annals, Vol. 41(1) (1992), p.141-144.

Google Scholar

[4] X. Lv, J.L. Yuan, Y. Dai: Key Engineering Materials, Vol. 304-305 (2005), p.398-402.

Google Scholar