E–J Characteristics in Multilayer Ceramic Capacitors with the Thin Dielectric Layers

Abstract:

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The factors causing a decrease in the resistivity of multilayer ceramic capacitors (MLCCs) with a decrease in the thickness of dielectric layers were examined by carrying out measurements and finite element method (FEM) simulations. The obtained electric field vs. current density plots (E–J characteristics) indicated that the local concentration of electric field increased with the decrease in the thickness of the dielectric layers. The investigation of the local concentration of electric field at the grain boundaries using an FEM showed that the decrease in resistivity was caused by the roughness of the interface between dielectric layers and inner electrodes and the presence of large grains in the dielectric layers.

Info:

Periodical:

Key Engineering Materials (Volumes 421-422)

Edited by:

Tadashi Takenaka, Hajime Haneda, Kazumi Kato, Masasuke Takata and Kazuo Shinozaki

Pages:

277-280

DOI:

10.4028/www.scientific.net/KEM.421-422.277

Citation:

M. Nakano et al., "E–J Characteristics in Multilayer Ceramic Capacitors with the Thin Dielectric Layers", Key Engineering Materials, Vols. 421-422, pp. 277-280, 2010

Online since:

December 2009

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Price:

$35.00

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