Behavior of Hydrogen Atoms in Perovskite-Type Oxide Thin Films under Electric Fields

Kentaro Morito; Toshimasa Suzuki; Youichi Mizuno; Isao Sakaguchi; Naoki Ohashi; Kenji Matsumoto; Hajime Haneda

doi:10.4028/www.scientific.net/KEM.421-422.281

Paper Titles

Pinched Hysteresis Scaling in Hybrid-Doped BaTiO₃
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Synthesis of Nano-Sized Barium Titanate Powder by Rotary-Hydrothermal Process
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Wide Range Dielectric Spectroscopy of Barium Strontium Titanate Ceramics
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E–J Characteristics in Multilayer Ceramic Capacitors with the Thin Dielectric Layers
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Behavior of Hydrogen Atoms in Perovskite-Type Oxide Thin Films under Electric Fields
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The Effects of Sintering Temperature Variations on some Physical Properties of Al₂O₃-SiO₂-PbO-MgO Laminated Tape System
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Sintering Behavior of Silver Particles in Electrode for Multilayer Ceramic Substrate
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The Influence of BaTiO₃ Tetragonality by Solid State Synthesis on MLCC’s Dielectric Characteristics
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Electrical Properties of Conductive Paste with Silver Nanoparticles and its Application to Flexible Substrates
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HomeKey Engineering MaterialsKey Engineering Materials Vols. 421-422Behavior of Hydrogen Atoms in Perovskite-Type...

Behavior of Hydrogen Atoms in Perovskite-Type Oxide Thin Films under Electric Fields

Abstract:

The behavior of hydrogen in (Ba,Sr)TiO3 (BST) thin film capacitors under electric fields was investigated by performing secondary ion mass spectroscopy (SIMS) analyses. It was clearly observed that the ingress of atmospheric hydrogen into BST thin film capacitors occurred through the anode and that it diffused toward the cathode under electric fields. In addition, it was found that the deterioration of the I-V properties of the BST thin film capacitors can be interpreted in terms of the distribution of hydrogen concentration in the BST thin films.

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Key Engineering Materials (Volumes 421-422)

Pages:

281-284

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.421-422.281

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Online since:

December 2009

Authors:

Kentaro Morito, Toshimasa Suzuki, Youichi Mizuno, Isao Sakaguchi, Naoki Ohashi, Kenji Matsumoto, Hajime Haneda

Keywords:

Barium Strontium Titanate, Capacitor, Deuterium, Electric Field, Highly Accelerated Life Test (HALT), Hydrogen, I-V Property, Secondary Ion Mass Spectroscopy (SIMS), Thin Film

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References

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