Stress State Localized Analysis on the Tip of the Crack
In this paper is presented a study of the analysis of the stress state of micro specimens exposed to a load inside the column of a High Voltage Electron Microscope (HVTEM), in particular for a Mo single crystal. The experimental tangential stresses distribution images were obtained and compared with theoretical calculations using Naiber approach, obtaining an excellent match.
Alexander Balankin, José Martínez Trinidad and Orlando Susarrey Huerta
P. A. Tamayo Meza et al., "Stress State Localized Analysis on the Tip of the Crack", Key Engineering Materials, Vol. 449, pp. 87-95, 2010