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Stress State Localized Analysis on the Tip of the Crack

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Abstract:

In this paper is presented a study of the analysis of the stress state of micro specimens exposed to a load inside the column of a High Voltage Electron Microscope (HVTEM), in particular for a Mo single crystal. The experimental tangential stresses distribution images were obtained and compared with theoretical calculations using Naiber approach, obtaining an excellent match.

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Periodical:

Key Engineering Materials (Volume 449)

Pages:

87-95

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.449.87

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Online since:

September 2010

Authors:

Pedro A. Tamayo Meza, Pablo S. Schabes-Retchkiman, Alejandra Lazo Noguez, Viacheslav A. Yermishkin

Keywords:

Crack, Crack Analysis, Diffraction Pattern, Dislocation, Edge Dislocations, HVTEM

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© 2010 Trans Tech Publications Ltd. All Rights Reserved

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