Stress State Localized Analysis on the Tip of the Crack

Abstract:

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In this paper is presented a study of the analysis of the stress state of micro specimens exposed to a load inside the column of a High Voltage Electron Microscope (HVTEM), in particular for a Mo single crystal. The experimental tangential stresses distribution images were obtained and compared with theoretical calculations using Naiber approach, obtaining an excellent match.

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Edited by:

Alexander Balankin, José Martínez Trinidad and Orlando Susarrey Huerta

Pages:

87-95

DOI:

10.4028/www.scientific.net/KEM.449.87

Citation:

P. A. Tamayo Meza et al., "Stress State Localized Analysis on the Tip of the Crack", Key Engineering Materials, Vol. 449, pp. 87-95, 2010

Online since:

September 2010

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$35.00

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