K-S Relationship Identification Technique by EBSD
This paper focuses on the identification of activated slip system in flat specimens of hot- and cold-rolled UNS S32750 DSS plates subjected to low-cycle fatigue, paying particular attention on the existence of the K-S relationship. Electron Backscattered Diffraction (EBSD) technique was used to determine the local crystallographic properties of both phases. Although 27182 couples of α/γ grains were analyzed, the crystallographic K-S relationships were rarely observed between them. As a conclusion, it was observed that microcracks were mostly nucleated at grain boundaries and rarely at the extrusions.
M.C. Marinelli et al., "K-S Relationship Identification Technique by EBSD", Key Engineering Materials, Vol. 465, pp. 415-418, 2011