K-S Relationship Identification Technique by EBSD

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This paper focuses on the identification of activated slip system in flat specimens of hot- and cold-rolled UNS S32750 DSS plates subjected to low-cycle fatigue, paying particular attention on the existence of the K-S relationship. Electron Backscattered Diffraction (EBSD) technique was used to determine the local crystallographic properties of both phases. Although 27182 couples of α/γ grains were analyzed, the crystallographic K-S relationships were rarely observed between them. As a conclusion, it was observed that microcracks were mostly nucleated at grain boundaries and rarely at the extrusions.

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415-418

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January 2011

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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