K-S Relationship Identification Technique by EBSD

Abstract:

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This paper focuses on the identification of activated slip system in flat specimens of hot- and cold-rolled UNS S32750 DSS plates subjected to low-cycle fatigue, paying particular attention on the existence of the K-S relationship. Electron Backscattered Diffraction (EBSD) technique was used to determine the local crystallographic properties of both phases. Although 27182 couples of α/γ grains were analyzed, the crystallographic K-S relationships were rarely observed between them. As a conclusion, it was observed that microcracks were mostly nucleated at grain boundaries and rarely at the extrusions.

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Periodical:

Edited by:

Pavel Šandera

Pages:

415-418

DOI:

10.4028/www.scientific.net/KEM.465.415

Citation:

M.C. Marinelli et al., "K-S Relationship Identification Technique by EBSD", Key Engineering Materials, Vol. 465, pp. 415-418, 2011

Online since:

January 2011

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Price:

$35.00

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