The Schematic Design of Scanning Electron Microscope Sample Stages with the Function of Structural Dynamic Observation

Abstract:

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At present, the structural dynamic observation by scanning electron microscope (SEM) has a wide range application in the research and production of materials. In this scheme, the sample stages with the function of stretching, compressing, bending and twisting samples are designed by reforming the construction of scanning electron microscope sample stage. Specifically, the aim of conducting structural dynamic observation is achieved by installing different mechanical clamping devices on the scanning electron microscope sample stage base. Furthermore, the sample stage has simple structure, low lost and practical advantages.

Info:

Periodical:

Key Engineering Materials (Volumes 480-481)

Edited by:

Yanwen Wu

Pages:

1091-1094

DOI:

10.4028/www.scientific.net/KEM.480-481.1091

Citation:

K. G. Liu and X. Q. Sun, "The Schematic Design of Scanning Electron Microscope Sample Stages with the Function of Structural Dynamic Observation", Key Engineering Materials, Vols. 480-481, pp. 1091-1094, 2011

Online since:

June 2011

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Price:

$35.00

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