[1]
Y.Q. Su, Y.L. Liu, X.Y. Liu et al: Semiconductor Technology Vol. 34 (8) (2009), pp.730-733.
Google Scholar
[2]
M. Li, M. Li and Y.W. Zhu: Diamond & Abrasives Engineering Vol. 173(5) (2009), pp.17-21.
Google Scholar
[3]
D.M. Guo, R.K. Kang, J.X. Su et al: Mechanical Engineering Vol. 39(10) (2003), pp.100-105.
Google Scholar
[4]
Gehman B L: Solid State Technology Vol. 44 (2001), pp.127-128.
Google Scholar
[5]
Luo J F, Dornfield D A: IEEE transactions on Semiconductor Manufacturing Vol. 14(2) (2001), pp.112-133.
Google Scholar
[6]
Rahul J, Janos F, Huang C K et al: Solid State Technology Vol. 37(7) (1994), pp.71-75.
Google Scholar
[7]
T. Lei, X.P. Wang et al: Materials Review Vol. 23(1) (2009), pp.7-11.
Google Scholar
[8]
Z.Y. Wang: Study of ZnO&GaN Wide Band-gap Semiconductors: Microstructure Modulation and Property Characterization (Dissertation Shandong University 2009).
Google Scholar
[9]
H.M. Chen: Semiconductor Technology Vol. 35(8) (2010), pp.749-752+756.
Google Scholar
[10]
ROSKER M: Wide band-gap semiconductor devices and MMICs: a DARPA perspective [EB/OL]. [2009-09] http: /www. gaasmantech. org/Digests/2005/2005 papers/1. 2. pdf.
Google Scholar
[11]
Next generation semiconductor materials and process technology (MIRAI) project [EB/OL]. [2008-10] http: /www. nedo. go. jp/kankobutsu/pamphlets/kouhou/2008gaiyo_ e/15 _24. pdf.
Google Scholar
[12]
GAUTHIER G, REPTIN F. KORRIGAN: development of GaN HEMT technology in europe [EB/OL]. [2007-01] http: /www. mantech. org/Digests/2006/2006% 20Digests/3D. pdf.
Google Scholar
[13]
WALSHR J, HERZOG A H. Process for polishing semiconductor materials [P]. US Patent: US3170273, 1965-02-23.
Google Scholar
[14]
Michael A. Fury: Solid State Technology Vol. 40(5) (1997), pp.81-86.
Google Scholar
[15]
C.H. Zhang and J.B. Luo: China Mechanical Engineering Vol. 16(14) (2005), pp.1282-1284.
Google Scholar
[16]
Park K H, Kim K J, Chang O M: Journal of Materials Processing Technology Vol. 187-188 (2007), pp.73-76.
Google Scholar
[17]
VH Nguyen, AJ Hof, H. Van Kranenburg et al: Microelectronic Engineering Vol. 55(4) (2001), pp.305-312.
Google Scholar
[18]
G. Menk, R. Marks, G. Leung, A. Iyer, J. Diao, Y. Zhou, C. Lee: International Conference on Planarization/CMP Technology(ICPT) Proceedings (Dresden, Germany, Octobe 25-27, 2007).
Google Scholar
[19]
Venkata R. Gorantla, Rajasekhar Venigalla, Laertis Economikos et al: Journal of The Electrochemical Society Vol. 150(12) (2003), pp.821-825.
Google Scholar
[20]
Jie Diao, Garlen Leung, Jun Qian, Sean Cui, Anand Iyer et al: ASMC(Advanced Semiconductor Manufacturing Conference) Proceedings(San Francisco, CA, USA, July 11-13, 2010).
Google Scholar
[21]
P. van der Velden: Microelectronic Engineering Vol. 50(4) (2000), pp.41-46.
Google Scholar
[22]
Keleher J, Rushing K, Joe Zhao, Wojtczak B., Yuzhuo Li.: Chemical-Mechanical Planarization. Symposium (San Francisco, CA, USA, April 22-24, 2003).
Google Scholar
[23]
Tateishi T, Gao Q, Tani Y et al: CIRP Annuals-Manufacturing Technology Vol. 55(1) (2006), pp.321-324.
Google Scholar
[24]
Hoyoun Kim, Beumyoung Park, Sangick Lee et al: Journal of Electrochemical Society Vol. 151(12) (2004), pp.858-862.
Google Scholar
[25]
Fujita Tsutomu, Enomoto Toshiyuki, Tominaga Shigeru, Suzuki Makoto: Nihon Kikai Gakkai Ronbunshu C Vol. 74(1) (2008), pp.219-224.
Google Scholar
[26]
Enomoto Toshiyuki, Fujita Tsutomu, Tominaga Shigeru, Suzuki Makoto: Nihon Kikai Gakkai Ronbunshu C Vol. 73(2) (2007), pp.639-644.
Google Scholar
[27]
Cheng-Yi Shih, Pei-Lum Tso, Sung, J.C.: Advanced Materials Research Vol. 76-78 (2009), pp.410-415.
Google Scholar
[28]
J. Wang, J. Li, Y.W. Zhu et al: Diamond & Abrasives Engineering Vol. (2) (2009), pp.13-17.
Google Scholar
[29]
Y. W Zhu, J. Wang, J. Li et al: China Mechanical Engineering Vol. 37(03) (2009), pp.723-727.
Google Scholar
[30]
J. Li, D.W. Zuo, Y.W. Zhu et al: Machinery Manufacturing and Automation Vol. 37(6) (2008), pp.5-8.
Google Scholar
[31]
Y. Zhang. Research of fixed abrasive cryogenic polishing (Dissertation Jilin University of Technology 1999).
Google Scholar
[32]
Y.L. Sun, D.W. Zuo, Y.W. Zhu et al: Chinese Journal of Chemical Physics Vol. 20 (2007), pp.643-648.
Google Scholar
[33]
Y.L. Sun, D.W. Zuo, Y.W. Zhu et al: Advanced Materials Research Vol. 24-25 (2007), pp.177-182.
Google Scholar
[34]
J. Kang, D.W. Zuo et al: Machinery manufacturing and research Vol. 38(2) (2009), pp.73-77.
Google Scholar
[35]
Z.G. Wang: Material progress of China Vol. 28(1) (2009), pp.26-30.
Google Scholar