Structural and Thermal Characterization of Polymorphic Er2Si2O7

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Abstract:

The first measurement of thermal transport properties on the polycrystalline D-Er2Si2O7 have been made in the temperature range 77-300K. Both the thermal conductivity and the thermal diffusivity follow modified Euckens law in this temperature region. The Transient Plane Source technique (TPS) has been used to measure thermal conductivity and thermal diffusivity simultaneously.

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Key Engineering Materials (Volumes 510-511)

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255-260

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May 2012

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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