Preparation and Characterization of Nano-Porous SiO2/TiO2-SiO2 Thin Films on Glass Substrates by Sol-Gel Method

Qing Nan Zhao; Ying Liu; Shao Hong Hou; Wu Zeng; Jie Sun

doi:10.4028/www.scientific.net/KEM.531-532.651

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 531-532Preparation and Characterization of Nano-Porous...

Preparation and Characterization of Nano-Porous SiO₂/TiO₂-SiO₂Thin Films on Glass Substrates by Sol-Gel Method

Abstract:

Nano-porous bilayers structure antireflection films on glass substrate were prepared by sol-gel method, tetraethyl orthosilicate(TEOS) and tetrabutyl titanate(TEOT) as the main raw materials, cetyl trimethyl ammonium bromide(CTAB) and polyethylene glycol(PEG) as template. The relation of the template agent addition, pH, and aging time to surface morphology and optical properties were analyzed. When the CTAB/TEOS = 1/30, the average spectral transmittance in the visible wavelength is 93.69% and the peak transmission is up to 97.37%. All the bilayers antireflection films are amorphous structure, uniform surface morphology, dense nano-porous size distribution, pore size is about 10nm.

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Periodical:

Key Engineering Materials (Volumes 531-532)

Pages:

651-654

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.531-532.651

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Online since:

December 2012

Authors:

Qing Nan Zhao, Ying Liu, Shao Hong Hou, Wu Zeng, Jie Sun

Keywords:

Antireflection, Nano-Porou, SiO₂/TiO₂-SiO₂ Thin Film, Sol-Gel (SG), Template Agent Addition

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References

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