One-Axis-Oriented Crystal Growth of Lead Zirconate Titanate Thin Films on Metal Substrates Using Perovskite-Type Oxide Nanosheet Layer

Y. Minemura; Y. Kondoh; H. Funakubo; Hiroshi Uchida

doi:10.4028/www.scientific.net/KEM.582.15

Paper Titles

Preface

Domain Contribution to Elastic Nonlinearity in Pb(Zr, Ti)O₃-Based Piezoelectric Ceramics
p.3

Fabrication of Lead Zirconate Titanate Thin Films by Inkjet Printing
p.7

Preparation and Characterization of Spherical Fine Nickel Particles by Ultrasonic Spray Pyrolysis
p.11

One-Axis-Oriented Crystal Growth of Lead Zirconate Titanate Thin Films on Metal Substrates Using Perovskite-Type Oxide Nanosheet Layer
p.15

TEM Analysis of the Nanostructure of Pb(Mg_1/3Nb_2/3)O₃ Thin Films by MOD Method
p.19

Preparation of Barium Titanate Nanoperticles with Necking Structure/Polymer Complex and their Dielectric Properties
p.23

Preparation of Barium Titanate Grain-Oriented Ceramics by Electrophoresis Deposition Method under High Magnetic Field Using Single-Domain Nanoparticles
p.27

Microstructure Control of Porous Barium Titanate Ceramics and their Sensor Properties
p.32

HomeKey Engineering MaterialsKey Engineering Materials Vol. 582One-Axis-Oriented Crystal Growth of Lead Zirconate...

One-Axis-Oriented Crystal Growth of Lead Zirconate Titanate Thin Films on Metal Substrates Using Perovskite-Type Oxide Nanosheet Layer

Abstract:

One-axis-oriented Pb (Zr,Ti)O₃ (PZT) films were fabricated using a chemical solution deposition technique on (111)Pt/TiO₂/(100)Si and Inconel625 substrates buffered by nanosheet Ca₂Nb₃O₁₀ (ns-CN). The (001)-oriented PZT crystals (Zr/Ti=0.40:0.60, tetragonal) were preferentially grown on (001)ns-CN/Inconel625, whereas the PZT crystals deposited on (001)ns-CN/(111)Pt/ TiO₂/(100)Si exhibited preferential PZT(100) orientation. The resulting PZT film on (001)ns-CN/Inconel625 indicated remanent polarization of approximately 59 μC/cm², which was significantly larger than that on (001)ns-CN/(111)Pt/TiO₂/(100)Si.