TEM Observation and Ionic Conductivity Study of Li2SiO3 Thin-Film on Sapphire Substrate

Shinichi Furusawa; Takao Tsurui; Kouhei Shimizu

doi:10.4028/www.scientific.net/KEM.596.15

Paper Titles

Preface

Estimation of Order Parameter and Spin Moment of Fe₃Pt by White X-Ray Diffraction Method
p.3

Study of Perpendicular Magnetic Anisotropy in Co/Au Multilayer Probed by Magnetic Compton Profile
p.8

TEM Observation and Ionic Conductivity Study of Li₂SiO₃ Thin-Film on Sapphire Substrate
p.15

Electrical Properties of SnS Films Deposited by Thermal Evaporation of Sulfurized Sn Powder
p.21

Growth of La_{1-_x}Ba_xCoO₃ Single Crystals and their Structural and Magnetic Properties
p.26

Composition Dependence of the Glass Network Structure in Li⁺-ion Conducting Glasses of (LiCl)_x(LiPO₃)_{1-_x} Studied by ³¹P MAS NMR
p.31

Improvement of Photovoltage in Dye-Sensitized Solar Cells with Azobenzene and Azulene Sensitizing Dyes by Applying Br₃^-/Br^- Redox Mediator
p.35

Nitrification of Nb-Modified Titanias Prepared by the Solvothermal Method and their Photocatalytic Activities under Visible-Light Irradiation
p.43

HomeKey Engineering MaterialsKey Engineering Materials Vol. 596TEM Observation and Ionic Conductivity Study of...

TEM Observation and Ionic Conductivity Study of Li₂SiO₃ Thin-Film on Sapphire Substrate

Abstract:

Thin-film samples of the lithium ionic conductor Li₂SiO₃ (LSO) were deposited on an A-plane sapphire substrate via the pulsed laser deposition (PLD) method, and the irreversible temperature dependence of the ionic conductivity in the thin-film samples was studied. Via transmission electron microscopy (TEM) observations of annealed LSO thin-film, it was found that the as-prepared LSO thin-film was amorphous over the temperature range T 490 K, and that nanocrystals existed in the annealed LSO thin-film in the temperature range T 550 K. Further more, it was clarified the irreversible temperature dependence of the ionic conductivity is due to the generation of nanocrystals.

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Key Engineering Materials (Volume 596)

Pages:

15-20

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.596.15

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Online since:

December 2013

Authors:

Shinichi Furusawa, Takao Tsurui, Kouhei Shimizu

Keywords:

Ionic Conductivity, Li₂SiO₃, Nanocrystal, TEM, Thin Film

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