Microstructures and Highly Accelerated Lifetime Test of X5R Type BaTiO3-Based Ni-MLCC with Ultra-Thin Active Layers

Hui Ling Gong; Xiao Hui Wang; Shao Peng Zhang; Xin Ye Yang; Long Tu Li

doi:10.4028/www.scientific.net/KEM.602-603.695

Paper Titles

Fatigue Short Crack Growth and Mechanism of GH4133B Superalloy Used in Turbine Disk of Aero-Engine
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Controllable Thermal Expansion in In_2-xFe_xMo_xO₁₂
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Influence of Phase Composition on Dielectric Properties of Bismuth-Based Ceramics with Scheelite-Type Structure
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Synthesis and Microstructure Characterization of Gd- and Sc-Co-Doped BaTiO₃ Nanopowders via Sol-Gel Method
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Microstructures and Highly Accelerated Lifetime Test of X5R Type BaTiO₃-Based Ni-MLCC with Ultra-Thin Active Layers
p.695

Dielectric Properties and Microstructure of Y-Al-Ga-Si Co-Doped Barium Titanate Ceramics
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Temperature-Dependent Structure of a High-k (Ba,La)(Ti,Ce)O₃ Ceramic
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Effect of Mn²⁺ Additive on the Sinterability and Dielectric Properties of Ba_0.55Sr_0.4Ca_0.05TiO₃-MgO Composite Ceramics
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Effect of Al₂O₃ and MgO Additives on Dielectric Properties of BaZr_xTi_1-xO₃-Based Ceramics
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Microstructures and Highly Accelerated Lifetime Test of X5R Type BaTiO₃-Based Ni-MLCC with Ultra-Thin Active Layers

Abstract:

Microstructure control in thin-layer multilayer ceramic capacitors (MLCCs) is one of the challenges for increasing capacitive volumetric efficiency and high voltage dielectric properties. In this paper, the X5R-MLCCs with ultra-thin dielectric layers (~1.2 μm) owning uniform grain size distribution were prepared by wet casting process. The microstructures and dielectric properties of the MLCCs were investigated. The existence of core-shell structure was proved by transmission electron microscopy observation and energy dispersive spectroscopy analysis. The existence of core-shell structure makes the temperature coefficient of capacitance (TCC) performance meet X5R standard. Moreover, a highly accelerated lifetime test (HALT) result shows that MLCCs with ultra-thin layers under high electric field are more easily to fail with increasing test temperatures. And the results reveal that the activation energy is similar to the value reported for mid-dielectric constant dielectrics.