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HomeKey Engineering MaterialsKey Engineering Materials Vol. 633Effect of Annealing Temperature on the Structures...

Effect of Annealing Temperature on the Structures and Properties of Bi_4.15Nd_0.85Ti₃FeO₁₅ Thin Films

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Abstract:

To investigate the effect of annealing temperature on the structures and properties of Bi_4.15Nd_0.85Ti₃FeO₁₅ (BNTF), their thin films with four perovskite slabs were deposited on Pt/Ti/SiO₂/Si substrates by the metal-organic decomposition method. Good remanent polarization and excellent fatigue resistance were observed at room temperature. The BNTF thin films annealed at 780°C presented better ferroelectricity than those annealed at 700°C-780°C. Ferromagnetic of BNTF thin films was not observed at room temperature.

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Testing and Evaluation of Inorganic Materials V

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Periodical:

Key Engineering Materials (Volume 633)

Pages:

290-294

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.633.290

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Online since:

November 2014

Authors:

Yu Pei, Feng Ming Pan*

Keywords:

Annealing Temperature, Multiferroic Property, Thin Film

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© 2015 Trans Tech Publications Ltd. All Rights Reserved

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