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Photoreflectance Characterization of the Internal Electric Fields across the N-Type GaAs/Al0.3Ga0.7As Heterojunctions in MBE Grown Material

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Periodical:

Key Engineering Materials (Volume 65)

Pages:

177-182

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.65.177

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January 1992

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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