Paper Titles

Photoreflectance Characterization of the Internal Electric Fields across the N-Type GaAs/Al_0.3Ga_0.7As Heterojunctions in MBE Grown Material
p.177

Comparison of Far Infrared and Raman Spectroscopy for Studying Phonon Confinement in Superlattices
p.183

Far Infrared Attenuatted Total Reflection Spectroscopy for Studying Superlattice Structures
p.191

Optical Characterization of A3-B5 Semiconductors, Heterstructures and Quantum Wells by Photoreflectance
p.199

FIR Spectroscopy of PbTe Films on KCI Substrates
p.207

Hot LO-Phonon Population in A3-B5 and A2-B6 Semiconductors and in AlGaAs-GaAs Quantum Wells
p.215

Light Selfdiffraction Spectra in CdSe at 4.2 K
p.221

Ellipsometric Diagnostics of the GaAs-Oxide Structure
p.225

Anisotropic Excitons in a Magnetic Field
p.233

HomeKey Engineering MaterialsKey Engineering Materials Vol. 65Light Selfdiffraction Spectra in CdSe at 4.2 K

Light Selfdiffraction Spectra in CdSe at 4.2 K

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Optical Characterization of Semiconductors

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Periodical:

Key Engineering Materials (Volume 65)

Pages:

221-224

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.65.221

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January 1992

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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