Photoreflectance Characterization of the Internal Electric Fields across the N-Type GaAs/Al0.3Ga0.7As Heterojunctions in MBE Grown Material
p.177
p.177
Comparison of Far Infrared and Raman Spectroscopy for Studying Phonon Confinement in Superlattices
p.183
p.183
Far Infrared Attenuatted Total Reflection Spectroscopy for Studying Superlattice Structures
p.191
p.191
Optical Characterization of A3-B5 Semiconductors, Heterstructures and Quantum Wells by Photoreflectance
p.199
p.199
FIR Spectroscopy of PbTe Films on KCI Substrates
p.207
p.207
Hot LO-Phonon Population in A3-B5 and A2-B6 Semiconductors and in AlGaAs-GaAs Quantum Wells
p.215
p.215
Light Selfdiffraction Spectra in CdSe at 4.2 K
p.221
p.221
Ellipsometric Diagnostics of the GaAs-Oxide Structure
p.225
p.225
Anisotropic Excitons in a Magnetic Field
p.233
p.233
Ellipsometric Diagnostics of the GaAs-Oxide Structure
Abstract:
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Periodical:
Key Engineering Materials (Volume 65)
Pages:
225-232
Citation:
Online since:
January 1992
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Сopyright:
© 1992 Trans Tech Publications Ltd. All Rights Reserved
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