Energy Distributions of 662 keV Multiply Compton-Scattered Photons in Copper

Pruek Prongsamrong; Kittipong Siengsanoh; P. Limkitjaroenporn; P. Kanchanakul; J. Kaewkhao

doi:10.4028/www.scientific.net/KEM.675-676.726

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 675-676Energy Distributions of 662 keV Multiply...

Energy Distributions of 662 keV Multiply Compton-Scattered Photons in Copper

Abstract:

A scattered photons spectrum from Compton effect were observed by pulse-height distribution of a NaI(Tl) scintillation detector. This also results in extraction of intensity distribution of multiply scattered events originating from interactions of 662 keV photons with both targets of copper sizes. The observed pulse-height distributions are a combination of singly and multiply scattered events in same photopeak. To evaluate the contribution of multiply scattered events, the spectrum of singly scattered events used reconstructed analytically. The results show that the lowest multiply scattered events occur at scattering angle 90 degree.

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Periodical:

Key Engineering Materials (Volumes 675-676)

Pages:

726-729

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.675-676.726

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Online since:

January 2016

Authors:

Pruek Prongsamrong, Kittipong Siengsanoh*, P. Limkitjaroenporn, P. Kanchanakul, J. Kaewkhao

Keywords:

Energy Distribution, Multiply Compton-Scattered

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References

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