In Situ Measurements of Raman Spectra for PLZT Ceramics under Compressive Stresses

Abstract:

A lanthanum doped lead zirconate titanate (PLZT) ceramic specimen was prepared by the conventional solid state reaction method. The crystal phase and morphology of the PLZT specimen were characterized by XRD and SEM techniques, with the hysteresis loop by RT6000HVS system. The compressive stress was applied to the PLZT specimen through the microtest mechanical loading device. In-situ Raman spectra focused on a fixed grain under various compressive stresses were recorded for different polarization directions of the scattered light. The effects of stresses on the Raman spectra and the intensity ratio between the E+B1 and E(2TO) modes are discussed.

• Periodical: Key Engineering Materials (Volume 680)
• Pages: 25-29
• DOI: https://doi.org/10.4028/www.scientific.net/KEM.680.25
• Online since: February 2016
• Authors: Li Ping Liang, Xuan Cheng, Ying Zhang*
• Keywords: Compressive Stress, Domain Switching, Ferroelectric Ceramic, Raman Spectrum

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