On the Characterization Method of Nano Boron Nitride Material Based on AFM

Mei Lin Gao Sun; Ping Wu; Hai Jian Li

doi:10.4028/www.scientific.net/KEM.680.21

Paper Titles

Design and Application of Testing Equipment for Determining the Mechanical Properties of Ceramics at Ultrahigh Temperatures
p.3

Evaluating High Temperature Modulus and Strength of Alumina Tube in Vacuum by a Modified Split Ring Method
p.9

Determining Elastic Modulus of Ceramic Coatings at Elevated Temperature Using Impulse Excitation Technology
p.13

Backscattered Electron Imaging and Image Analysis Technology for Determining the Fly Ash Content in Hardened Cement Mortar
p.17

On the Characterization Method of Nano Boron Nitride Material Based on AFM
p.21

In Situ Measurements of Raman Spectra for PLZT Ceramics under Compressive Stresses
p.25

Mapping Nanoscale Switching Behavior of PZT Domain Patterns by Scanning Probe Microscope
p.30

Analysis of the Effect of Interferometer Cavity Distortion on Homogeneity Tests of Large-Diameter Optical Materials
p.35

On the Methods for Measuring High Temperature Resistivity of Glass
p.39

HomeKey Engineering MaterialsKey Engineering Materials Vol. 680On the Characterization Method of Nano Boron...

On the Characterization Method of Nano Boron Nitride Material Based on AFM

Abstract:

Boron nitride materials have some excellent features, such as high temperature resistance, chemical resistance, good electric performance and radiation resistance . Along with the development of science and technology, boron nitride materials are made into coating widely, put it in the surface of metallic materials or non-metallic materials, can extend their service life significantly[1]. Atomic force microscope (AFM) is widely used for nanoscale morphology characterization and submicron scale structure material, simple sample preparation is its advantage. [2] Based on the domestic boron nitride coating as the research background, using AFM simulate the surface nanostructures of three dimensional, and evaluate the flatness of boron nitride ceramic coating which made by plasma spraying method and chemical vapor phase precipitation method respectively. The results show that the coating prepared with plasma spraying is more dense, surface flatness is smaller, surface roughness uniformity is better.

You might also be interested in these eBooks

Properties and Testing Techniques of Inorganic Materials

View Preview

Info:

Periodical:

Key Engineering Materials (Volume 680)

Pages:

21-24

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.680.21

Citation:

Cite this paper

Online since:

February 2016

Authors:

Mei Lin Gao Sun*, Ping Wu, Hai Jian Li

Keywords:

AFM, Boron Nitride Materials, Flatness, Surface of Three Dimensional

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

* - Corresponding Author

References

[1] Z. Hong, Research on synthesis and properties of nano boron nitride, gallium nitride and zinc sulfide of nanomaterials. Wenzhou university. 2011, 11-13.

Google Scholar

[2] Goriachko A, Zakharov A A, Over H. J. Phys. Chem. C, 2008, 112 ( 28) : 10423—10427.

Google Scholar

[3] D. Gao-liang, S. Michael and e. al. Dimensional metrology at PTB to support optical fabrication. Nanotechnology and Precision Engineering, 2011, 9(5): 377-391.

Google Scholar

[4] L. Tong-bao. Nanometer measurement and transmission standard. Shanghai metering, 2005, 1(185): 8-13.

Google Scholar

[5] C. Xiao-hui,Z. Yang and e. al. Measurement methods and development trend of optical nanometer. Optical technology, 1999, (3): 73-77.

Google Scholar

[6] M. M, T. Y and e. al. Nano position sensing based on laser trapping technique for flat surfaces. Meas. Sci. Technol., 2008, 19(8): 1-7.

DOI: 10.1088/0957-0233/19/8/084013

Google Scholar

[7] L. E, D. D and e. al. 3D capability for nanopositioning and nanometrology. Laser Photonics, 2011, 1): 36-39.

Google Scholar

[8] G. Jäger, T. Hausotte and e. al. Nanomeasuring and nanopositioning engineering. Measurement, 2010, 43(9): 1099-1105.

DOI: 10.1016/j.measurement.2010.04.008

Google Scholar

[9] G. Tong, H. Chun-guang and e. al. Applied in the size of the mems characterization by Vertical scanning white light interferometry. Journal of the optical, 2007, 27(4): 668-672.

Google Scholar