Effect of Humidity and Bias on the Size of Nanostructures Fabricated by STM Anodization and its Application to Patterns

Article Preview

Abstract:

In this paper, the effect of humidity and sample bias on the size of nanostructures fabricated by STM anodization on a 3 nm-thick Ti film was investigated by random nano-arrays. 3.5 V and 4 V bias were applied to samples at a relative humidity of ~30% while 3.5 V, 4 V and 4.5 V were applied to samples at a relative humidity of ~43%. According to the cross section analyses, dots scattered randomly on surfaces became larger and higher as the bias increased at a constant relative humidity or as the relative humidity increased at the same bias. Two complicated patterns were fabricated by running a program in which the movement of STM tip and the sample bias were defined.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

35-40

Citation:

Online since:

July 2016

Authors:

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2016 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] M. A. MoCord, R. F. W. Pease: J. Vac. Sci. Technol. B, Vol. 4 (1986), p.86.

Google Scholar

[2] C.R.K. Marrian, E.A. Dobisz and R. J. Colton: J. Vac. Sci. Tchnol. A, Vol. 8 (1990), p.3563.

Google Scholar

[3] J. A. Dagata, J. Schneir, H. H. Harary, C. M. Evans, M. T. Postek, and J. Bennett: Appl. Phys. Lett., Vol. 56 (1990), p. (2001).

Google Scholar

[4] J. A. Dagata, J. Schneir, H. H. Harary, J. Bennett and W. Tseng: J. Vac. Sci. Technol. B, Vol. 9 (1991), p.1384.

Google Scholar

[5] N. Barniol, F. Perez-Murano, and X. Aymerich: Appl. Phys, Lett., Vol. 61 (1992), p.462.

Google Scholar

[6] H. Sugimura, T. Yamamoto, and N. Nakagiri: Appl. Phys. Lett., Vol. 65, (1994), p.1569.

Google Scholar

[7] Y. Yin, J.F. Jiang, Q.Y. Cai, and B.C. Cai: Chin. J. Electron., Vol. 12, (2003), p.451.

Google Scholar

[8] K. Hu, et al.: Ultramicroscopy, Vol. 115, (2012), p.7.

Google Scholar

[9] O. Ozcan, et al.: Micro & Nano Lett., Vol. 9, (2014), p.332.

Google Scholar

[10] K. Matsumoto, et al.: Appl. Phys. Lett., Vol. 68, (1996), p.34.

Google Scholar