Advanced Synchrotron Radiation and Neutron Scattering Techniques for Microstructural Characterization in Industrial Research

Abstract:

The rapid development of new materials and their application in an extremely wide variety of research and technological fields has lead to the request of increasingly sophisticated characterization methods. In particular residual stress measurements by neutron diffraction, small angle scattering of X-rays and neutrons, as well as 3D imaging techniques with spatial resolution at the micron or even sub-micron scale, like micro-and nano-computerized tomography, have gained a great relevance in recent years.Residual stresses are autobalancing stresses existing in a free body not submitted to any external surface force. Several manufacturing processes, as well as thermal and mechanical treatments, leave residual stresses within the components. Bragg diffraction of X-rays and neutrons can be used to determine residual elastic strains (and then residual stresses by knowing the material elastic constants) in a non-destructive way. Small Angle Scattering of neutrons or X-rays, complementary to Transmission Electron Microscopy, allows the determination of structural features such as volume fraction, specific surface and size distribution of inhomogeneities embedded in a matrix, in a huge variety of materials of industrial interest. X-ray microtomography is similar to conventional Computed Tomography employed in Medicine, allowing 3D imaging of the investigated samples, but with a much higher spatial resolution, down to the sub-micron scale. Some examples of applications of the experimental techniques mentioned above are described and discussed.

• Periodical: Key Engineering Materials (Volume 750)
• Pages: 53-66
• DOI: https://doi.org/10.4028/www.scientific.net/KEM.750.53
• Online since: August 2017
• Authors: Fabrizio Fiori*, Emmanuelle Girardin, Alessandra Giuliani, Adrian Manescu, Serena Mazzoni, Franco Rustichelli, Evzen Amler
• Keywords: Diffraction, Neutrons, Residual Stresses, Small-Angle Scattering, Synchrotron Radiation, Tomography

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