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HomeKey Engineering MaterialsKey Engineering Materials Vols. 86-87Micro-Scale and Nano-Scale Testing of Materials...

Micro-Scale and Nano-Scale Testing of Materials Using Scanned Probe Technologies

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Engineered Materials

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Periodical:

Key Engineering Materials (Volumes 86-87)

Pages:

207-214

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.86-87.207

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Online since:

July 1993

Authors:

M. Phelan, L. McDonnell, E.M. Cashell, J.O. Dalton

Keywords:

Material Testing, Scanning Force Microscopy, Scanning Probe

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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