Micro-Scale and Nano-Scale Testing of Materials Using Scanned Probe Technologies

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Periodical:

Key Engineering Materials (Volumes 86-87)

Main Theme:

Edited by:

S. Hampshire, M. Buggy and A. J. Carr

Pages:

207-214

DOI:

10.4028/www.scientific.net/KEM.86-87.207

Citation:

M. Phelan et al., "Micro-Scale and Nano-Scale Testing of Materials Using Scanned Probe Technologies", Key Engineering Materials, Vols. 86-87, pp. 207-214, 1993

Online since:

July 1993

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Price:

$35.00

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