Scanning Force Microscopy and Its Application to Engineered Materials

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Periodical:

Key Engineering Materials (Volumes 86-87)

Main Theme:

Edited by:

S. Hampshire, M. Buggy and A. J. Carr

Pages:

231-236

DOI:

10.4028/www.scientific.net/KEM.86-87.231

Citation:

L. McDonnell et al., "Scanning Force Microscopy and Its Application to Engineered Materials", Key Engineering Materials, Vols. 86-87, pp. 231-236, 1993

Online since:

July 1993

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$35.00

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