High-Resolution Electron Microscopy Studies on Si3N4 Ceramics

Abstract:

Article Preview

Info:

Periodical:

Key Engineering Materials (Volumes 89-91)

Main Theme:

Edited by:

Michael J. Hoffmann, Paul F. Becher and Günther Petzow

Pages:

339-344

DOI:

10.4028/www.scientific.net/KEM.89-91.339

Citation:

H.J. Kleebe "High-Resolution Electron Microscopy Studies on Si3N4 Ceramics", Key Engineering Materials, Vols. 89-91, pp. 339-344, 1994

Online since:

August 1993

Authors:

Export:

Price:

$35.00

In order to see related information, you need to Login.