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Characterization of the Matrix Morphology in Si₃N₄ Ceramics Formed with Different Additives
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HomeKey Engineering MaterialsKey Engineering Materials Vols. 89-91Quantitative Description of Si3N4 Microstructures

Quantitative Description of Si₃N₄ Microstructures

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Silicon Nitride '93

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Periodical:

Key Engineering Materials (Volumes 89-91)

Pages:

465-470

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.89-91.465

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Online since:

August 1993

Authors:

F. Mücklich, S. Hartmann, Michael J. Hoffmann, Gerold A. Schneider, J. Ohser, Günter Petzow

Keywords:

Stereology, Image Analysis, Microstructure Characterization

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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