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Paper Titles
Quantitative Description of Si3N4 Microstructures
p.465
Quantitative Analysis of Si3N4 Microstructure Response on Interface Chemistry
p.471
Characterization of the Matrix Morphology in Si3N4 Ceramics Formed with Different Additives
p.477
Nucleation and Growth of Si2N2O in Si3N4-Materials Employing Different Sintering Additives
p.483
Development of Microstructure in Si3N4 Ceramics Formed with Additions of ZrO2, Y2O3 and Al2O3
p.489
Study of Grain Boundary Phase in Silicon Nitride Materials by Raman Spectroscopy
p.495
Grain Growth in Si3N4
p.501
Grain Boundary Fracture Resistance of Silicon Nitride
p.509
R-Curve Behaviour and Subcritical Crack Growth of Reinforced Si3N4 Ceramics
p.517

Development of Microstructure in Si3N4 Ceramics Formed with Additions of ZrO2, Y2O3 and Al2O3

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Periodical:

Key Engineering Materials (Volumes 89-91)

Pages:

489-494

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.89-91.489

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Online since:

August 1993

Authors:

L.K.L. Falk

Keywords:

Densification, Microstructure, Zirconia

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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