Study of Deformed Si and Ge by Positron Lifetime Measurements

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Periodical:

Materials Science Forum (Volumes 105-110)

Edited by:

Zs. Kajcsos and Cs. Szeles

Pages:

1101-1104

DOI:

10.4028/www.scientific.net/MSF.105-110.1101

Citation:

R. Krause et al., "Study of Deformed Si and Ge by Positron Lifetime Measurements", Materials Science Forum, Vols. 105-110, pp. 1101-1104, 1992

Online since:

January 1992

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$35.00

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