The Development of Grain-Specific Texture and Grain Boundary Character during Grain Growth of Al-1%Si Films on SiO2/Si Substrates
p.619
p.619
The Effect of Grain-Specific Texture on Hillock Growth in Al-1%Si Films on SiO2/Si Substrates
p.625
p.625
Multiple Twinning in the Solid Phase Crystallization of Amorphous Germanium
p.631
p.631
The Effect of Substrate Conditions on the Formation of Crystalline Particles in Amorphous Germanium Films
p.637
p.637
X-Ray Texture Measurements for Determining Quantitatively the Recrystallized Volume Fraction in Aluminium Alloys
p.643
p.643
A Study of Recovery, Recrystallization, Grain Growth and Phase Transformations during the Annealing of Cold-Worked Zircaloy-4
p.649
p.649
A Direct Method for Determining the Recrystallization of a Cold Rolled Copper
p.655
p.655
On the Formation of Low Energy Grain Boundaries in a Spheres-on-Plate Experiment
p.661
p.661
The Assessment of Recrystallization in Low Carbon Low Alloy Steel Using Alternating Current Potential Drop (ACPD) Measurements
p.667
p.667
X-Ray Texture Measurements for Determining Quantitatively the Recrystallized Volume Fraction in Aluminium Alloys
Abstract:
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Periodical:
Materials Science Forum (Volumes 113-115)
Pages:
643-648
Citation:
Online since:
January 1993
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© 1993 Trans Tech Publications Ltd. All Rights Reserved
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