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HomeMaterials Science ForumMaterials Science Forum Vols. 113-115Automatic Local Texture Measurements by EBSP

Automatic Local Texture Measurements by EBSP

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Recrystallization '92

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Periodical:

Materials Science Forum (Volumes 113-115)

Pages:

679-684

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.113-115.679

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Online since:

January 1993

Authors:

N.C.K. Lassen, D.J. Jensen

Keywords:

Automatic Analysis, Backscattered Electrons, Computer Procedure, Crystallographic Orientation, Electron Back Scattering Patterns, Electron Diffraction (ED), Hough Transform (HT), Image Processing, Line Detection

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Сopyright:

© 1993 Trans Tech Publications Ltd. All Rights Reserved

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