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White-Beam X-Ray Sectional Topography of Anthracene Single Crystals Grown by Physical Vapor Transport Technique
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White-Beam X-Ray Sectional Topography of Anthracene Single Crystals Grown by Physical Vapor Transport Technique

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Abstract:

White-beam X-ray sectional topography enabled the successful evaluation of the quality of anthracene single crystals grown by the physical vapor transport technique; however, such single crystals exhibited a thin plateletlike configuration and their quality is difficult to evaluate in the cross-sectional direction. The experimental results showed that the anthracene single crystals grown by the physical vapor transport technique maintained their high quality; however, they tended to have widespread hollows inside owing to their specific configuration.

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Periodical:

Materials Science Forum (Volume 1169)

Pages:

3-8

DOI:

https://doi.org/10.4028/p-EI67xk

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Online since:

November 2025

Authors:

Sadaharu Jo*, Kentaro Kajiwara, Hitoshi Yoshikawa

Keywords:

Anthracene Single Crystal, Morphology, Physical Vapor Transport Technique, Sectional Topograph, White-Beam X-Ray Topography

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© 2025 Trans Tech Publications Ltd. All Rights Reserved

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