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HomeMaterials Science ForumMaterials Science Forum Vols. 126-128Analysis of SiC-SiO2 Interfaces by TEM

Analysis of SiC-SiO₂ Interfaces by TEM

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Intergranular and Interphase Boundaries in Materials

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Periodical:

Materials Science Forum (Volumes 126-128)

Pages:

599-602

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.126-128.599

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Online since:

January 1993

Authors:

F. Gourbilleau, Gerard Nouet

Keywords:

Cristobalite, Interface, Oxidation, Silicon Carbide (SiC), TEM

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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