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HomeMaterials Science ForumMaterials Science Forum Vols. 126-128HRTEM Analysis of a Cu-AIN Interface

HRTEM Analysis of a Cu-AIN Interface

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Intergranular and Interphase Boundaries in Materials

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Periodical:

Materials Science Forum (Volumes 126-128)

Pages:

703-706

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.126-128.703

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Online since:

January 1993

Authors:

J. Du, A. Traverse, S. Hagège

Keywords:

High Resolution Transmission Electron Microscopy, Ion Implantation, Metal-Ceramic Interface, Precipitation

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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