Paper Titles

Microstructures and Flux-Pinning in Melt-Processed YBa₂Cu₃0_7-x
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HREM Observation of the Effects of 180 MeV Cu¹¹⁺ Ion-Irradiation on the Crystal Structure of Bi₂Sr₂CaCu₂O_x
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Direct Observation of Oxygen Atoms in YBCO Superconductors by an Ultra-High-Resolution HVEM
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Oxygen Ordering and Critical Temperature Plateaus in ABa₂Cu₃O_7-δ (A=Yb, Sm, Nd) Compounds
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Probing of Carriers in Oxide Superconductors
p.49

Surface Atomic Imaging of High T_c Superconductors
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Scanning Tunneling Microscope Studies of Bi₂Sr₂CaCu₂O_x Single Crystals
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Structural Characterization of Epitaxial YBa₂Cu₃O₇ Thin Films on Step-Edge Substrates by Means of High-Resolution Electron Mcroscopy
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The Structural Characterization of Bi₂Sr₂CaCu₂O_x Superconducting Thin Films on (001) Sr TiO₃ Substrates
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HomeMaterials Science ForumMaterials Science Forum Vol. 129Probing of Carriers in Oxide Superconductors

Probing of Carriers in Oxide Superconductors

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Periodical:

Materials Science Forum (Volume 129)

Pages:

49-64

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.129.49

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Online since:

January 1993

Authors:

J. Yuan, N.D. Browning, L.M. Brown

Keywords:

EELS, Grain Boundary, Hole Density, Overdoping, P-Type Oxide Superconductors

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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