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HomeMaterials Science ForumMaterials Science Forum Vol. 129Structural Characterization of Epitaxial YBa2Cu3O7...

Structural Characterization of Epitaxial YBa₂Cu₃O₇ Thin Films on Step-Edge Substrates by Means of High-Resolution Electron Mcroscopy

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Periodical:

Materials Science Forum (Volume 129)

Pages:

99-118

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.129.99

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Online since:

January 1993

Authors:

C.L. Jia, B. Kabius, K. Urban

Keywords:

Film Growth, Grain Boundary, High Resolution Electron Microscopy (HREM), Step-Edge Junction, Thin Film

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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