Structural Characterization of Epitaxial YBa2Cu3O7 Thin Films on Step-Edge Substrates by Means of High-Resolution Electron Mcroscopy

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Edited by:

K.H. Kuo and J.P. Zhang

Pages:

99-118

DOI:

10.4028/www.scientific.net/MSF.129.99

Citation:

C.L. Jia et al., "Structural Characterization of Epitaxial YBa2Cu3O7 Thin Films on Step-Edge Substrates by Means of High-Resolution Electron Mcroscopy ", Materials Science Forum, Vol. 129, pp. 99-118, 1993

Online since:

January 1993

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